Scan-Based Testing Using FPGA

Abstract

Testing in VLSI circuits plays a crucial role in ensuring the reliability, functionality, and overall performance of integrated systems. As circuit complexity increases, the need for effective fault detection methods becomes even more critical. Among various testing techniques, scan-based testing has emerged as a widely adopted approach due to its ability to improve fault coverage and facilitate easier debugging. However, in the case of FPGA implementations, traditional scan test methods present significant challenges, primarily related to high power consumption, prolonged test times, and increased switching activity. These factors not only impact the efficiency of the testing process but also raise concerns about circuit degradation and thermal stress.

To address these challenges, this paper introduces an optimized scan-based testing approach tailored specifically for FPGA platforms. The proposed methodology focuses on two key aspects: low-power test pattern generation and efficient scan chain design, both of which are essential for reducing unnecessary switching activity and improving testing efficiency. By strategically designing power-aware scan architecture, the approach effectively minimizes delays while maintaining high fault coverage.

The proposed methodology has been implemented in Verilog and rigorously tested using industry-standard tools, Xilinx Vivado, and Cadence simulation environments. The experimental results demonstrate a remarkable 66.67% reduction in power consumption, alongside enhancements in scan shift efficiency and significant reductions in test application time. Furthermore, a detailed comparative analysis highlights how this optimized FPGA-based solution achieves performance metrics closer to ASIC implementations, making it a viable alternative for power-sensitive applications where test power reduction is a critical requirement.