https://matjournals.net/engineering/index.php/RRECE/issue/feedResearch & Review: Electronics and Communication Engineering2026-05-13T08:55:09+00:00Open Journal Systems<p><strong>RRECE</strong> is a peer-reviewed journal in the field of Electronics Engineering published by MAT Journals Pvt. Ltd. RRECE is a print e-journal focused on the rapid publication of fundamental research papers on all areas of Electronics and Communication Systems. This Journal involves the basic principles of individual communications networks, transmission systems, relay stations, tributary stations, Antennas, wave propagation and data terminal equipment. The Journal aims to promote high-quality research, review articles, and case studies, mainly focusing on Electronic Sensors and Sensory Systems, Mobile Communication, Networking, Wide-Band CDMA (W-CDMA), Multi-Code CDMA (MC-CDMA), Telecommunications, Modulation Techniques, Analog Communication Systems, Digital Communication Systems. This journal involves comprehensive coverage of all theoretical and experimental aspects of electronic and communication engineering.</p>https://matjournals.net/engineering/index.php/RRECE/article/view/3556Experimental Validation of Ohm’s Law under Varying Temperature Conditions2026-05-13T08:31:27+00:00A. S. M. Shamim Hasanmohammadali.rmu@gmail.comMd. Alimohammadali.rmu@gmail.comMd. Sumon Alimohammadali.rmu@gmail.comSyed Tohabbul Murshedmohammadali.rmu@gmail.comMd. Tanvin Mahfuz Tuhinmohammadali.rmu@gmail.com<p><em>This study presents a comprehensive experimental investigation into the validity and limitations of Ohm’s law under varying temperature conditions. While Ohm’s law assumes a constant resistance and linear voltage-current (V-I) relationship, practical conductive materials exhibit temperature-dependent resistance, leading to measurable deviations from ideal behavior. In this work, a controlled experimental framework was developed to analyze the impact of temperature on electrical resistance using a fixed metallic resistor over a temperature range of 25 to 75°C. Systematic V-I measurements were conducted at multiple temperature levels, with repeated trials to ensure reliability and minimize experimental uncertainty. The results demonstrate that the linear relationship between voltage and current is preserved under isothermal conditions; however, the slope of the V-I characteristics decreases with increasing temperature, indicating a rise in resistance. This behavior is further validated using the temperature-resistance model, confirming a positive temperature coefficient of resistance. To quantify non-ideal effects, percentage deviation from the reference resistance was calculated, revealing an increase from approximately 0% at 25°C to over 11.22% at 75°C. Additionally, slope analysis of the V-I curves highlights the inverse relationship between conductance and temperature, providing deeper insight into the underlying physical mechanisms. The experimental findings closely align with theoretical predictions, with deviations remaining within acceptable error margins. Unlike conventional demonstrations that neglect thermal effects, this study introduces a reproducible, low-cost methodology incorporating multi-temperature measurements, uncertainty analysis, and quantitative deviation assessment. The proposed approach not only enhances the practical understanding of Ohm’s Law but also provides a valuable framework for analyzing non-ideal electrical behavior in real-world applications, including power systems, electronic devices, and sensor technologies.</em></p>2026-05-13T00:00:00+00:00Copyright (c) 2026 Research & Review: Electronics and Communication Engineering