Dayana Mary V, Nandhini P, Nagadharshini S, Praveena S, and Thenmozhi P. “Thermal Analysis and Reliability Assessment of RF MEMS Switches”. Journal of RF and Microwave Communication Technologies, May 2025, pp. 1-10, https://matjournals.net/engineering/index.php/JoRFMCT/article/view/1851.