DAYANA MARY V; NANDHINI P; NAGADHARSHINI S; PRAVEENA S; THENMOZHI P. Thermal Analysis and Reliability Assessment of RF MEMS Switches. Journal of RF and Microwave Communication Technologies, [S. l.], p. 1–10, 2025. Disponível em: https://matjournals.net/engineering/index.php/JoRFMCT/article/view/1851. Acesso em: 2 nov. 2025.