DATTATRAY G. TAKALE; PARIKSHIT N. MAHALLE; BIPIN SULE. Detecting Anomalies in IOT Devices through Machine Learning Techniques. Journal of Data Mining and Management, [S. l.], v. 9, n. 1, p. 40–46, 2024. Disponível em: https://matjournals.net/engineering/index.php/JoDMM/article/view/304. Acesso em: 16 nov. 2025.