Journal of Digital Integrated Circuits in Electrical Devices
https://matjournals.net/engineering/index.php/JDICED
<p>Journal of Digital Integrated Circuits in Electrical Devices is a print e-journal focused towards the rapid Publication of fundamental research papers on all areas of Digital Integrated Circuits in Electrical Devices. This Journal involves the basic principles of electronic circuits on one small chip of semiconductor material, normally silicon. This can be made much smaller than a discrete circuit made from independent electronic components. Focus and Scope covers Semiconductor Device, Manufacturing of IC, Electronic Components, Transistors, Programmable Logic Devices, Electronic Design Automation, Programmable Logic Controller, Logic Gates, Sequential Systems and Combinational Systems, Synchronous Systems, Register Transfer Systems, Computer Design and Architecture</p>en-USJournal of Digital Integrated Circuits in Electrical DevicesAnalysis of Transformer Performance using MATLAB
https://matjournals.net/engineering/index.php/JDICED/article/view/1269
<p>In this paper, this study presents a comprehensive analysis of transformer performance utilizing MATLAB simulations. Transformers are critical components in electrical power systems, and their efficiency, voltage regulation, and operational characteristics are essential for reliable energy distribution. The analysis focuses on modeling the transformer using MATLAB's Simulink environment, enabling the evaluation of various performance metrics under different load conditions and fault scenarios. Key parameters such as efficiency, voltage regulation, and thermal performance are examined, highlighting the influence of winding resistance, core losses, and load variations. The results demonstrate the capability of MATLAB to simulate and analyze transformer behavior accurately, providing valuable insights for engineers to optimize transformer design and operation. This approach facilitates the identification of potential issues, enhances the understanding of transformer dynamics, and contributes to improved reliability and efficiency in electrical systems.</p>N. S. JadhavPankaj A. PatilVaibhav K. PartePriya A. Shinge
Copyright (c) 2024 Journal of Digital Integrated Circuits in Electrical Devices
2024-12-302024-12-30933543Method for Adaptive Threshold Start Relocation Driven Garbage Collection Scheme for NAND Flash Memory-based Solid State Drives (SSDs)
https://matjournals.net/engineering/index.php/JDICED/article/view/1139
<p><em>In NAND flash memory, host-initiated rewrites and deletions can fragment data within blocks, while wear-out factors further challenge data integrity and drive lifespan. Relocation, a data consolidation or migration process, is crucial for maintaining NAND performance and endurance. A Solid-State Drive (SSD) storage device enhances writing performance through an automated process called garbage collection, where a whole block erasure is optimally avoided before each write operation. Most SSD controllers execute garbage collection algorithms during off-peak hours to preserve optimal write rates during regular operations. To prevent overused blocks from wearing out, most SSD controllers include wear leveling in their garbage collection processes. This allows P/E cycles to be distributed more evenly throughout the storage blocks. However, conventional fixed-threshold relocation algorithms for Garbage Collection (GC), particularly in consumer NAND products with constrained DRAM, often need to optimize NAND capabilities fully. To address this, we propose an innovative adaptive relocation threshold algorithm that dynamically adjusts relocation initiation based on real-time NAND health metrics, including Program/Erase Cycles (PEC) and Write Amplification (WA). This algorithm delivers significantly smoother SSD performance, extends product lifespan, and meticulously balances NAND characteristics, unlocking its full potential. </em></p>Thomas TaDhanu GorrleAajna Karki
Copyright (c) 2024 Journal of Digital Integrated Circuits in Electrical Devices
2024-11-292024-11-29932025Design and Optimization of ROM Access Patterns for Minimal Power Consumption
https://matjournals.net/engineering/index.php/JDICED/article/view/936
<p><em>The goal of this research is to reduce energy consumption during read operations by designing and implementing low-power read circuitry for ROM. To ensure efficient ROM access, strategies such as voltage scaling, current reduction, and optimized sensing methods will be investigated. Low-power ROM architecture minimizes energy consumption in digital systems by employing dynamic voltage and frequency scaling, adaptive read assist techniques, and efficient power management. These techniques are integrated into the same circuit to reduce dynamic power dissipation, using gated clock or transmission-gated circuits. The aim is to analyze the power dissipation of a 32-bit ROM by applying gating techniques. By utilizing low-power ROM architecture techniques, energy consumption in ROM can be minimized while enhancing performance. Dynamic Voltage and Frequency Scaling (DVFS) demonstrates its critical role in balancing performance and power efficiency through dynamic adjustments. Read-Only Memory (ROM) data storage is optimized by energy-aware programming algorithms, which dynamically modify parameters to reduce power consumption and improve energy efficiency in digital systems. Real-time monitoring and control in ROM involve dynamically adjusting memory operations based on workload and environmental conditions, optimizing both energy efficiency and performance.</em></p>Aditya Prakash BogalkarK. B. Ramesh
Copyright (c) 2024 Journal of Digital Integrated Circuits in Electrical Devices
2024-09-162024-09-169319Protection of Transformer from Lightning Surge using Matlab
https://matjournals.net/engineering/index.php/JDICED/article/view/1142
<p><em>Power transformers are among the most critical components of electrical supplies. Such devices are prone to lightning surges and will get severely damaged, influencing the stability and reliability of a system. Such spikes must be mitigated through appropriate strategies for the protection of all. This paper performs a Matlab simulation study for the Transformer behavior under lightning surge and protection techniques such as shedder placement, Surge Arresters, and earthing mechanisms for the reliable operation of Transformers. The results from this simulation can guide strategies for transformer protection, which may help enhance its immunity towards transients caused by lightning. These simulation results provide essential information regarding the protective configurations and their influence on a transformer's performance under stress conditions. The location and design of surge arresters are also studied as part of the appropriate insulation coordination for protection from high-voltage transients. This information will offer the basis for engineers and system designers to create more robust power systems and enhance transformer protection standards.</em></p>N. S. JadhavAkshata Raviraj KoliVibhavari Baban KoliEkta Rupesh Kamble
Copyright (c) 2024 Journal of Digital Integrated Circuits in Electrical Devices
2024-11-302024-11-30932634Effective Application of Formal Verification Techniques for VLSI Digital Design Verification
https://matjournals.net/engineering/index.php/JDICED/article/view/1004
<p><em>The design of CMOS Digital Integrated Circuits (ICs) is becoming increasingly complicated, making it challenging to achieve design verification objectives like code or functional coverage closure. These difficulties result in endless design verification time and effort for every digital design. The main issue with design verification that modern silicon designs on formal verification platforms and simulation/stimulation-driven platforms encounter is Functional Verification signoff towards Silicon Tape-Out. Currently, functional verification signoff on RTL digital designs relies on CAD/EDA tools in conjunction with random seed capability of constrained random verification approaches like Universal Verification Methodology (UVM) and Formal Verification Methodology (FVM) based on mathematical proofing procedures. A custom-specific criterion known as Formal Verification Convergence is based on the verification objectives developed and certified by the Formal Tool, and it considers their success or failure as well as their exhaustiveness and reachability. The ability to mathematically demonstrate the equivalency between two distinct versions of the same RTL Designs is fundamental in Formal Verification. This paper will analyze the formal verification techniques suited for effective deployment on VLSI digital designs towards formal verification convergence, guaranteeing bug-free silicon tape-outs. Specifically, we will explore the 'equivalence checking' and 'feature checking' capabilities of Formal Verification Methodology (FVM) using IEEE 1800<sup>TM</sup> System Verilog Assertions.</em></p>Anantharaj Thalaimalai VanarajUmabaskari Kaliyanasundaram
Copyright (c) 2024 Journal of Digital Integrated Circuits in Electrical Devices
2024-10-102024-10-10931019