International Journal of Embedded System and VLSI Design https://matjournals.net/engineering/index.php/IJESVD en-US Mon, 12 Jan 2026 12:12:13 +0000 OJS 3.3.0.8 http://blogs.law.harvard.edu/tech/rss 60 Python/Silvaco-based Performance Simulation and Quantum Analysis of a 14 nm Si/Si3N4 Cylindrical GAA FET https://matjournals.net/engineering/index.php/IJESVD/article/view/3080 <p><em>This study presents a comprehensive TCAD and Python-based simulation study of an aggressively scaled (channel length is only 14 nm) cylindrical Gate-All-Around Field-Effect Transistor (CGAA FET) featuring a silicon channel and Si</em><em><sub>3</sub></em><em>N</em><em><sub>4 </sub></em><em>high-</em><em>κ </em><em>gate dielectric. The CGAA structure enhances superior gate control, leading to the suppression of short-channel effects and hence, its lower power consumption, whereas Si</em><em><sub>3</sub></em><em>N</em><em><sub>4 </sub></em><em>increases the drive current, leading to its high-speed operation. </em><em>Using Silvaco ATLAS Technology Computer-Aided Design simulations with quantum mechanical models and postprocessing Python scripts, the device’s electrical performance, quantum confinement effects, and scalability was characterised. Key extracted parameters at </em><em>V</em><em><sub>DS </sub></em><em>= 0</em><em>.</em><em>05 V</em> <em>include a threshold voltage (</em><em>V<sub>T</sub></em><em>) of 0.32 V, subthreshold swing (SS) of 68.5 mV/dec, drain-induced barrier lowering (DIBL) of 36.7 mV/V, and an on/off current ratio (</em><em>I</em><em><sub>on</sub></em><em>/I</em><em><sub>off</sub></em><em>) of </em><em>7.8 × 10<sup>7</sup></em><em>. Detailed analysis of energy band diagrams, density of states, and wave functions confirms strong quantum confinement in the 3 nm thick channel. The GAA architecture demonstrates excellent electrostatic control, making it promising for sub-10nm CMOS technology nodes. </em></p> Md. Tawrath, Md. Mohin Sarker, Saif Rahman, Md. Hojaifa Daiyan Chowdhury, Md. Rashique Hamjah Chowdhury, Muhammad Johirul Islam, Iqbal Bahar Chowdhury Copyright (c) 2026 International Journal of Embedded System and VLSI Design https://matjournals.net/engineering/index.php/IJESVD/article/view/3080 Sat, 07 Feb 2026 00:00:00 +0000